Presentation Information

[Th-P2-B-03]Forming Nanoscale Defect Array from 2D Ferroelectricity in Twisted Hexagonal Boron Nitride

〇Jacques Hawecker1, Ka Lun Michael Man1, Prajakta Kokate1, Marisa Hocking2, Will Millsaps2, Filchito Renee G. Bagsican1, Nanami Tomoda1, Harley Suchiang1, Xing Zhu1, Amrita Mitra1, Kenji Watanabe3, Takashi Taniguchi4, Julien Madéo1, Andrew J. Mannix2, Keshav M. Dani1 (1. 1 Femtosecond Spectroscopy Unit, Okinawa Institute of Science and Technology Graduate University (Japan), 2. Department of Materials Science and Engineering; Stanford University (USA), 3. Research Center for Electronic and Optical Materials, National Institute for Materials Science (Japan), 4. Center for Materials Nanoarchitectonics, National Institute for Materials Science (Japan))
Using Photoemission microscopy, we map the in-gap electronic energetics and spatial structure of ferroelectric twisted hexagonal Boron Nitride, revealing defects and domain wall states. Surprisingly, we find that for small moiré period, defects are preferentially located at the ferroelectric domain wall triple intersections.