Presentation Information
[We-P-56]Thickness Dependence of Superconducting Diode Efficiency in Fe(Se,Te)/FeTe Thin-Film Heterostructure Devices
〇Kaito - Arizono1, Kenshin - Inamura1, Junichi - Shiogai1,2, Tsutomu - Nojima3, Kouta - Kondou2, Jobu - Matsuno1,2 (1. Dep. of Phys., The Univ. of Osaka (Japan), 2. OTRI-Spin, The Univ. of Osaka (Japan), 3. IMR, Tohoku University (Japan))
We investigate Fe(Se,Te)-layer thickness (tFST) dependence of superconducting diode effect, the nonreciprocal response of the critical current, and perform the time evolution measurement of the rectification characteristics using the device with the optimal thickness.
