Presentation Information
[We-P-87]Rapid and High Sensitivity Temperature Imaging Using Electron-spin RF-Dressed States of Diamond NV Centers
〇Yuki Nagao1,2, Yuma Itabashi1,2, Yuichiro Matsuzaki3, Norio Tokuda4, Junko Hayase1,2 (1. Keio Univ. (Japan), 2. Keio CSRN (Japan), 3. Chuo Univ. (Japan), 4. Kanazawa Univ. (Japan))
We demonstrate rapid temperature imaging with diamond NV centers by combining the high-sensitivity temperature imaging method using RF-dressed states with fixed-frequency CW-ODMR. This approach significantly reduces measurement time compared to conventional frequency-sweeping methods while maintaining sub-Kelvin temperature resolution.