Presentation Information
[Tu-P-91LN]Frequency-Resolved Nanoscale Noise Spectroscopy of the SiC/SiO2 Interface Using Individual Quantum Sensors
*Jinpeng Liu1, Yuanhong Teng1, Yu Chen1, Qi Zhang1, Fazhan Shi1 (1. Univ. of Sci. and Tech. of China (China))
