Presentation Information
[Tu-P-92LN]Room-Temperature Optical Charge State Control of Native Defects in HPSI 4H-SiC for Power Electronics Device Diagnostics
*Agatha C. Ulibarri1,2, Brett C . Johnson3, Helton G. de Medeiros2, Daniel J. McCloskey1, Nikolai Dontschuk1, Alexander A. Wood1, Ulrike Grossner2 (1. Univ. of Melbourne (Australia), 2. APS Lab. ETH Zurich (Switzerland), 3. RMIT Univ. (Australia))