Presentation Information
[1]Analysis and Improvement of Bubble Defects in Narrow-Bezel Products after High-Reliability Steel Ball Drop Test
*Xianfei Zhu1, Zeyao Li1, Xiaowu Sun1, Xirong Han1, Tianhao Zhang1, Jianyu Cui1, Tian Lan1, Yuanguo Tan1, Ying Ye1, Menglin Yang1, Maokun Yang1, Zhaoxuan Zhu1, Ya Hu1, Minghong Shi1, Wade Chen1 (1. Chongqing HKC Optoelectronics Technology Co. Ltd. (China))
Keywords:
LCD,Bubble,CF-ITO,FIB
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