Presentation Information

[8]Research on Reliability Improvement of GOA Via Burn Damage under High Temperature and High Humidity Conditions in Triple-Gate LCD Displays

*Xu Chen1, Wei Tian Yang1, Jia Luo Dong1, Jian Ma1, Lin Wang1, Jin Miao He1, Shun Qiang Sun1, Shi Xin Wei1, Yi Ming Chen1, Shi Shuai Huang1, Bing Han1, Paul Shi1, Wade Chen1 (1. Chuzhou HKC Optoelectronics Technology Co., Ltd. (China))

Keywords:

Triple-Gate LCD,GOA,Via Burn Damage


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