Presentation Information
[3]Understanding Hole Transport Through Void-Assisted Extrinsic Charge Trapping in Organic Semiconductors(20min.)
*Keigo Ishii1, Kenichi Goushi1, Youichi Tsuchiya1, Kenji Ishida1, Chihaya Adachi1 (1. Kyushu University (Japan))
Keywords:
Trap-Charge-Limited Current,Drift–Diffusion Model,Molecular Dynamics Simulation,Host–Guest System
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