[P2-2] Emerging technologies in Packaging, thermal management, system integration and reliability 1

[P2-2-03] Electroluminescence-Based Online Condition Monitoring of Gate Switching Instability in SiC MOSFETs

*Lukas A. Ruppert¹, Nikita Huber¹, Christian Schmitz¹, Rik W. De Doncker¹ (1. Institute for Power Electronics and Electrical Drives, RWTH Aachen University (Germany))

Keywords:

SiC MOSFETs,Electroluminescence,Condition Monitoring,Gate Switching Instability