Presentation Information

[2A-07-OR]Quantitative estimation of quasi-Fermi level of holes at the surface of semiconductor photoanodes

*Yuu Shioiri1, Keisuke Obata1, Yudai Kawase1, Tomohiro Higashi2, Masao Katayama1,3, Kazuhiro Takanabe1 (1. Department of Chemical System Engineering, School of Engineering, The University of Tokyo (Japan), 2. Institute for Tenure Track Promotion, University of Miyazaki (Japan), 3. Environmental Science Center, The University of Tokyo (Japan))

Keywords:

Photoanode,Quasi-Fermi levels,Metal chalcogenide,Photocorrosion