R1: Characterization and description of minerals

10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)

[R1-05] Background holes in wavelength-dispersive X-ray spectrometry using thallium acid phthalate analyzing crystal

*Takenori Kato¹, Mi-Jung Jeen² (1. Nagoya Univ. ISEE, 2. Core Res. Facility, PNU)

Keywords:

Wavelength-dispersive spectrometer (WDS),Background hole,Electron probe microanalysis (EPMA),X-ray fluorescence analysis (XRF)

Background-holes in wavelength-dispersive spectrometer (WDS) using thallium acid phthalate (TAP) analyzing crystal has been determined. The TAP analyzing crystal has eight possible background hole locations.