Presentation Information

[R2-08]Single-crystal synchrotron X-ray diffraction study on a new Al2Si2O7 phase synthesized at the condition of 15.5 GPa and 2473 K

*Takahiro Kuribayashi1, Youmo Zhou2, Hiroaki Ohfuji2, Tetsuo Irifune2,3 (1. Tohoku Univ., 2. Ehime Univ. GRC, 3. Inst. Tech. Tokyo. ELS)

Keywords:

newly synthesized Al2Si2O7,Single-crystal X-ray diffraction,synchrotron,crystal structure

Single-crystal synchrotron X-ray diffraction study on a new Al2Si2O7 phase synthesized at the condition of 15.5 GPa and 2473 K were conducted to determine the crystal structure of the new phase. In this report, the detailed structural information of the new Al2Si2O7 phase will be shown.