Presentation Information

9:00 AM - 9:15 AM JST(12:00 AM - 12:15 AM UTC)

[17]Reliability analysis of electronic device by using synchrotron X-ray nano-CT
: Microstructural evolution of electrodes of MLCC

*Gaku OKUMA^1,2, Naoya SAITO², Kotaro MIZUNO³, Fumihiro WAKAI² (1. National Institute for Materials Science, 2. Tokyo Institute of Technology, 3. Taiyo Yuden Co., Ltd)

Keywords:

焼結,X線CT,MLCC,微構造

放射光X線ナノCTによる電子デバイスの３次元構造解析が，性能や耐久性の向上，高信頼性設計に役立つ事例として，積層セラミックスコンデンサーの電極形成プロセス観察について紹介する．

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Presentation Information

[17]Reliability analysis of electronic device by using synchrotron X-ray nano-CT: Microstructural evolution of electrodes of MLCC

Keywords:

[17]Reliability analysis of electronic device by using synchrotron X-ray nano-CT
: Microstructural evolution of electrodes of MLCC