Session Details
[G]Analysis/Characterization/Evaluation
Fri. Mar 15, 2024 1:00 PM - 4:00 PM JST
Fri. Mar 15, 2024 4:00 AM - 7:00 AM UTC
Fri. Mar 15, 2024 4:00 AM - 7:00 AM UTC
Rm. C Rm.504, 5th Flr.,Lecture Hall Blg.
座長:宇部 卓司(JFEテクノリサーチ)、山本 知一(九州大学)
※表示の講演時間には質疑応答時間も含みます。
(質疑応答時間5分、基調講演と招待講演は5~10分)
(質疑応答時間5分、基調講演と招待講演は5~10分)
[51]Microscopic phase separation in Ti-Zr-Nb-Ta-Zr alloy fabricated by laser powder bed fusion
*Daisuke EGUSA1, Chen Han1, Li Zehao2, Taisuke Sasaki1,2, Eiji Abe1,2 (1. University of Tokyo, 2. NIMS)
[52]Quantitative evaluation of microstructure in equiatomic TiZrTaNbMo high entropy alloy
*Haruka KATAYAMA1, Andrea Školáková2, Pavel Lejček2, Sadahiro Turekawa3 (1. KUMAMOTO University Science and Technology, 2. Institute of Physics of the Czech Academy of Sciences, 3. KUMAMOTO University Faculty of Advanced Science and Technology)
[53]Elastic strain field inside and around γ' precipitates on Ni-Al-Ti alloy
*Tomokazu MORITANI1, Kazuma Nakajima2, Hisashi Sato1, Yoshimi Watanabe1 (1. Nagoya Inst. Technol., 2. Nagoya Inst. Technol. (B4))
[54]Atomic-resolution STEM-EDS analysis of high-entropy perovskite nanoparticles
*Tomokazu YAMAMOTO1, Takaaki Toriyama1, Kohei Kusada2, Hiroshi Kitagawa2, Syo Matsumura3, Yasukazu Murakami1 (1. Kyushu University, 2. Kyoto University, 3. Kurume College)
break
[55]Solute atom mediated crystallization of amorphous Pd-Si alloy thin films
*Kazuhisa SATO1, Hirotaro MORI1 (1. Research Center for UHVEM, Osaka Univ.)
[56]Establishing commensurability index for heterointerfaces
*Kazutoshi INOUE1, Qian Chen1, Kazuaki Kawahara2, Mitsuhiro Saito2, Motoko Kotani1, Yuichi Ikuhara1,2,3 (1. AIMR, Tohoku Univ., 2. Inst. Eng. Innov., The Univ. Tokyo, 3. JFCC)
[57]Microscopy Studies on Magnetic Domains in a Magnetostrictive Fe-Ga Alloy
*Yuto Tomita1, Takehiro Tamaoka1, Mitsunari Auchi1, Yasukazu Murakami1, Nobuhisa Ono2, Hatayama Masatoshi2, Satoshi Okamoto2, Yu U. Wang3, Yongmei M. Jin3 (1. Kyushu Uniersity, 2. Tohoku University, 3. Michigan Technological University)
[58]Crystallography Analysis of Surface Colored Layer of Tamahagane by precession 4D-STEM
*Takuji Ube1, Kenji Ogata1, Kazunari Shibuya1, Kaoru Sato1, Tomokazu Moritani2 (1. JFE-TEC, 2. Nagoya Inst. of Technol.)
[59]Indexing of EBSD pattern with comparing simulation pattern
*Tatsuya FUKINO1, Suzuki Seiichi1 (1. 株式会社TSLソリューションズ)
[60]Particle analysis method using multi-segmented BED signals for SEM
*Kei Nagatomo1, Takeshi Otsuka1 (1. JEOL Ltd.)
