Session1-1

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[OP02] Shape analysis of two-dimensional diffraction patterns using topological data analysis

*Shun Obikane¹, Mika Suzuki¹, Junko Kuroki¹ (1. KOSÉ Corp.)

Keywords:

Two-dimensional diffraction pattern analysis,Topological data analysis,Image analysis