[16p-P01-1~5] 7 Beam Technology and Nanofabrication (Poster)

[16p-P01-2] Development of multi-edge time-resolved quick XAFS measurement system

〇Tomoya Uruga¹, Takuma Kaneko¹, Soichi Kikkawa², Kentaro Yonesato³, Hideyuki Kawasoko², Yasuhiko Imai¹, Kosuke Suzuki³, Seiji Yamazoe² (1.JASRI, 2.TMU, 3.UTokyo)

Keywords:

XAFS,time-resolved,operando

So far, we have developed operand time-resolved quick XAFS measurement methods at beamline BL36XU in SPring-8, and have been conducting research on changes in the electronic state and local structure of target elements during chemical reactions occurring in materials and devices. In this study, we report the development of multi-edge operando time-resolved quick XAFS measurement system.