[17p-A31-1~11] 4.3 Laser sources and Laser applications

5:15 PM - 5:45 PM JST(8:15 AM - 8:45 AM UTC)English Presentation

[17p-A31-11] 【Absence】[JSAP-Optica Joint Symposia Invited Talk] Highly efficient and aberration-corrected spectrometer and monochromator for extreme ultraviolet high harmonic light source

〇Jie Li^1,2, Hao Xu¹, Kui Li^1,2, Yutong Wang¹, Jiyue Tang^1,2, Yongjun Ma¹, Ruixuan Li^1,2, Jin Niu^1,2, Guangyin Zhang^1,2, Changjun Ke^1,2, Zhongwei Fan² (1.Aerospace Information Research Institute, Chinese Academy of Sciences, 2.School of Optoelectronics, University of the Chinese Academy of Sciences)

Keywords:

High-order harmonics,Extreme ultraviolet,EUV Spectrometer

The unique EUV and soft X-ray light sources based on high harmonic generation have been successfully utilized for probing femtosecond-to-attosecond dynamics in atomic, molecular, and solid-state systems in the EUV and soft X-ray spectral regions. However, due to the relatively low conversion efficiency of the high harmonic generation process, the applicability of these sources has been predominantly limited to spectroscopy, where fewer photons are required. Here, we report on the development of a spectrometer optimized for EUV light sources to address the low throughput efficiency over a broad spectral range, and to achieve a tunable, monochromic, aberration-free mode of operation. Our approach combines high efficiency, high spectral resolution, broad spectral range, and polarization-maintaining at the same time. This simple design is also cost-effective and easy to use for a vast range of EUV and soft X-ray wavelengths.