[17p-A35-1~6] Recent developments in semiconductor radiation detectors

3:15 PM - 3:45 PM JST(6:15 AM - 6:45 AM UTC)

[17p-A35-4] Evaluation of crystal quality and carrier transport properties of TlBr semiconductor detectors

〇Kenichi Watanabe¹, Sota Hasegawa¹, Yusuke Sugai¹, Seishiro Tanaka¹, Mitsuhiro Nogami², Keitaro Hitomi² (1.Kyushu Univ., 2.Tohoku Univ.)

Keywords:

TlBr,neutron diffraction,carrier transport property

We evaluated the crystal quality and carrier transport properties of TlBr semiconductor detectors. We compared the results of the crystal quality evaluated by neutron diffraction and the carrier transport properties evaluated by the time-of-flight method using pulsed-laser-induced carriers.