Presentation Information

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)English Presentation

[18a-A33-4]Thickness dependence of thermally excited near fields on metal thin films

〇KuanTing Lin¹, Yinghui Liang¹, Yusuke Kajihara¹ (1.Univ. Tokyo)

near-field microscopy,evanescent wave,metal thin film

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