[18a-B5-1~10] 11.5 Junction and circuit fabrication process, digital applications

10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)

[18a-B5-5] Design of an error rate test circuit for measuring radiation-induced malfunctions in superconducting circuits

〇Kazuto Osakabe¹, Yuki Yamanashi¹, Nobuyuki Yoshikawa¹ (1.Yokohama Natl. Univ.)

Keywords:

Superconductor,SFQ circuit

With the rapid development of information technology in recent years, single flux quantum circuits (SFQ circuits) have been proposed as an alternative circuit scheme to semiconductor integrated circuits, which can operate with low power consumption and high speed. Recently, it has been pointed out that secondary cosmic ray particles such as γ-rays can be a potential source of interference to large-scale superconducting circuits. In this study, we designed an error detection circuit to detect malfunctions of SFQ circuits with the aim of measuring the frequency of malfunctions caused by environmental radiation in SFQ circuits.