Presentation Information
[20a-C32-9]Influence of aging test on curved crystalline Si photovoltaic modules without encapsulant (II)
〇Yo Yamakawa1, Yuta Mikami1, Kazuma Ito1, Yasuhiro Okada2, Yohei Ogasiwa2, Hiroaki Takahashi2, Naoshi Kimura3, Shuntaro Shimpo4, Mitsunori Nagahara4, Keisuke Ohdaira4, Kazuhiro Gotoh1,5, Atsushi Masuda1,5 (1.Fac. Eng., Niigata Univ., 2.Kyocera Crop., 3.Okitsumo Inc., 4.JAIST, 5.IRCNT, Niigata Univ.)
Keywords:
photovoltaic modules,aging test,recycle
Comment
To browse or post comments, you must log in.Log in