Presentation Information
[8p-N203-11]Virtual Vernier Effect-Based Nano-Displacement Sensing Using Single-Cavity
Interferometry
〇(DC)Arvind Kumar Maurya1, Rajan Jha1 (1.IIT Bhubaneswar)
Keywords:
Fiber Interferometers,Nano-displacement sensor,Virtual Vernier effect
We present a nano-displacement sensing system based on the virtual Vernier effect using single-cavity interferometry. This method achieves a high resolution of 10 nanometers, improving upon the micrometer-scale sensitivity of conventional Fabry-Pérot cavity methods like dip tracking and free spectral range (FSR)-based measurements. It is accomplished by generating a virtual Fabry-Pérot (FP) cavity, which, when combined with a physical interferometer, creates the Vernier effect. By using a virtual reference instead of a physical reference arm, our design reduces optical components, lowering noise while enhancing compactness and cost-effectiveness. This streamlined system delivers precise measurements, making it compatible for nanotechnology and precision engineering applications.