Presentation Information
[9p-N306-9]Surface deformation analysis of AFM detected vibrations induced by femtosecond lasers at anthracene crystal
〇(D)Yuhau Ye1, Yuka Tsuri1,2, Yoichiroh Hosokawa1,2 (1.Div. Mat. Sci., NAIST, 2.MLC, NAIST)
Keywords:
femtosecond laser,acoustic wave,crystal
When an intense femtosecond (fs) pulse is focused on an object, an impulse is generated which propagates on the surface as a shock wave and a stress wave. We have developed a method to detect the waves by an atomic force microscope (AFM) cantilever contacted near the laser focal point. In this study, we applied this method in combination with partial least squares discriminant analysis (PLS-da), a statistical analysis method, to evaluate the extremely slight deformation of anthracene crystal surface with nanometer-scaled spatial resolution. To assess the surface differences before and after low fs intensity scanning, we carried out PLS-da on the frequency components of the vibrations. The score plots of the two PLS components maximize the differences of the frequency components. This result indicates that scanning induces deformations on the crystal surface, and that these differences can be detected by the vibrational response.