Presentation Information
[10a-PB1-30]Proposal of a Facile Method for Identifying Degradation Origins Caused by Non-Uniform Film Formation in Perovskite Solar Cells
〇Risa Minai1, Tomoyuki Tobe1,2, Nao Saito1, Tsutomu Miyasaka1, Masashi Ikegami1 (1.Toin Univ., 2.KISTEC.)
Keywords:
perovskite,durability,EL measurement
While improving durability of perovskite solar cells (PSCs) is essential for their scaling-up, analyzing degradation origins caused by deposition non-uniformity typically requires expensive equipment. In this study, we fabricated series-connected solar cells on 70 mm square ITO-PET substrates and investigated the correlation between coating methods, including inkjet printing, and device durability. Furthermore, focusing on the device's electroluminescence (EL) emission near 800 nm, we evaluated a simple method to identify degradation origins using a general-purpose infrared camera, aiming to establish a rapid screening technique.
