Presentation Information
[10p-A31-2]Flux Pinning Mechanism at Low-Temperature and High-Field in REBCO Tapes with various Oxygen Vacancy Contents
〇(M1)Tomoki Fukushima1, Kengo Miyakawa1, Ryosuke Sakagami1, Yuji Tsuchiya1, Satoshi Awaji1 (1.IMR, Tohoku Univ.)
Keywords:
REBCO tape,oxygen annealing,critical current density
While the enhancement of critical current density (Jc) through carrier overdoping is known in REBCO thin films, quantitative evaluation separating its effects on the matrix and pinning centers in commercial coated conductors with artificial pins remains insufficient. In this study, we performed low-temperature oxygen annealing on commercial BHO-doped EuBCO tapes manufactured by Fujikura and evaluated their Jc under low-temperature and high-magnetic-field conditions. As a result, the sample annealed at 300°C exhibited an enhancement in Jc at 4.2 K and 15 T. In the presentation, we will discuss the mechanism of this Jc enhancement and the origin of the pinning centers by separating the contributions of the matrix and pinning using the weak collective pinning model.
