Presentation Information
[8a-PB1-30]Fundamental study on local dielectric property measurement based on transient current response analysis
〇Hayato Katsume1, Tomohiro Kawashima1 (1.Toyohashi Univ. of Tech.)
Keywords:
transient current response analysis,silicone gel,self-healing
Electrical trees in silicone gels exhibit a self-healing phenomenon in which degradation traces optically disappear. However, local material property changes associated with this phenomenon remain unclear. In this study, a method for evaluating local dielectric properties based on transient current response measurements was investigated. Transient responses to voltage pulses were measured in silicone gel and epoxy resin samples. Differences in relaxation characteristics were observed depending on the material and measurement position. These results suggest that the proposed method has potential for evaluating local material property changes around electrical trees.