Presentation Information

1:45 PM - 2:00 PM JST(4:45 AM - 5:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[8p-F212-2]Development of Voltage-sweep Scanning Nonlinear Dielectric Microscopy

〇Masaki Fuse¹, Yoshiomi Hiranaga¹ (1.Tohoku Univ.)

Keywords:

ferroelectrics,Scanning Nonlinear Dielectric Microscopy,ferroelectric polarization switching

Scanning Nonlinear Dielectric Microscopy (SNDM) enables the observation of local dielectric responses and polarization states with nanoscale spatial resolution. In this study, to further elucidate the nonlinear characteristics of ferroelectrics, we improved the SNDM system and developed 'V-sweep SNDM,' which allows for AC bias amplitude sweeping. Using a depolarized congruent LiTaO₃ single crystal as a sample, our measurements confirmed a nonlinear response that is believed to reflect polarization switching behavior.

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