Presentation Information

11:30 AM - 11:45 AM JST(2:30 AM - 2:45 AM UTC)

[9a-E310-10]A Study on an Accuracy Validation Method for Non-Rigid Registration between APT Data and STEM Tomography Data Using Atomic-Scale Simulated Datasets II

〇(M2)Akito Mie¹, Yugant Gotmare¹, Kazunori Iwamitsu¹, Yoshito Otake¹, Zentaro Akase¹, Shigetaka Tomiya¹ (1.NAIST)

Keywords:

three-dimentional atom probe,Electron Tomography,Accuracy verification

The purpose of this study is to establish accuracy evaluation metrics for non-rigid registration (NRR) between APT data and STEM tomography data. Since the error map we have proposed thus far cannot sufficiently reflect the shape reproducibility of the overall structure, we introduced Normalized Mutual Information (NMI) as a new evaluation metric in this study.

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