Presentation Information
[9p-E217-9]Extension of Minority-Carrier Lifetimes in Cu2O via Stoichiometry Control
〇Kosuke Matsuzaki1, Thi Ngoc Huyen Vu2, Shota Nunomura1, Hitoshi Tampo1, Takehiko Nagai3, Yu Kumagai2 (1.AIST, 2.IMR, Tohoku Univ., 3.Kindai Univ.)
Keywords:
Cu2O,minority carrier lifetime,defect control
