Materials Development for Electronic Components in the AI Era

9:00 AM - 9:25 AM JST(12:00 AM - 12:25 AM UTC)

[1-29] Invited Talk : Development of a Deep Learning Model and Application for Predicting Material Properties from Microstructural Images 《 Physical, Property, property prediction 》

*Ryoichi FURUSHIMA¹ (1. National Institute of Advanced Industrial Science and Technology)

Keywords:

Microstucture Image,Property Prediction,Deep Learning,Silicon Nitride