Towards New Synthesis Technologies and Functionality Derived by External Field Effects

10:10 AM - 10:50 AM JST(1:10 AM - 1:50 AM UTC)

[2-27] Memorial Lecture of JSPM Award :
Application of advanced transmission electron microscopy to materials process technology 《 Sintering, Evaluation, Technology 》

*Takahisa Yamamoto¹ (1. Nagoya University)

Keywords:

flash sintering,microstructure,TEM,SEM,point defects