Presentation Information

[04aA-01]Thickness dependence of thermoelectric figure-of-merit in CoFeB films revealed by all-in-one evaluation method for transverse thermoelectric properties

○Takumi Yamazaki1, Norihiko L Okamoto1, Tetsu Ichitsubo1, Takeshi Seki1,2,3 (1. IMR, Tohoku Univ., 2. CSIS, Tohoku Univ., 3. SRIS, Tohoku Univ.)