Presentation Information
[Po137]Hydrogen in Al-Mn thin films characterized by ion beam analysis techniques
*Shunya Yamamoto1, Tomitsugu Taguchi1, Hiroyuki Saito1, Reina Utsumi1, Saya Ajito2 (1. National Institutes for Quantum Science and Technology (Japan), 2. Tohoku University (Japan))
Keywords:
Hydrogen,ion beam analysis,Al-Mn,thin films