[A4-O402] Oral 402

2:40 PM - 3:00 PM JST(5:40 AM - 6:00 AM UTC)

[A4-O402-05] Mitigation of Trapped Flux in Superconducting Electronic Circuits

*Alexei E. Koshelev¹, Dipanjan Ray¹, Robert Dawson¹, Tong Ren¹, Vitalii Vlasko-Vlasov¹, Andreas Glatz^2,3, Samuel Pate², Zhili Xiao², Oscar Leonard⁴, Simon Bending⁴, Leonardo Cadorim⁵, Milorad Milosevic⁵, Boldizsar Janko¹ (1. Univ. of Notre Dame (United States of America), 2. Northern Illinois Univ. (United States of America), 3. Argonne National Lab. (United States of America), 4. Univ. of Bath (UK), 5. Univ. Antwerpen (Belgium))

Keywords:

Trapped Flux,Superconducting Electronics,Vortex Pinning,Niobium Films