[B2-O202] Oral 202

3:40 PM - 4:00 PM JST(6:40 AM - 7:00 AM UTC)

[B2-O202-04] Machine Learning-Based Prediction of AFM Probe Spring Constants Using Classification and Regression Approaches

*Chun-Hung Wang¹, De-Wei Chen¹ (1. National Cheng Kung Univ. (Taiwan))

Keywords:

Atomic Force Microscopy,Deep Learning,Multiple Layer Perceptron,Recurrent Neural Network,Soft Label