[G5-O201] Oral 201

11:30 AM - 11:50 AM JST(2:30 AM - 2:50 AM UTC)

[G5-O201-05] Thickness Dependence of Electronic and Crystal Structures in VO₂(110)_R Ultrathin Films

*Seitaro Inoue¹, Daisuke Shiga^1,2, Sogen Watanabe¹, Ryotaro Hayasaka¹, Kenichi Ozawa², Hiroshi Kumigashira^1,2 (1. IMRAM, Tohoku University (Japan), 2. Photon Factory, IMSS, KEK (Japan))

Keywords:

Mott insulators,Peierls transition,Photoemission spectroscopy