Presentation Information
[S1-Poster_201-49]Unveiling Defect Motifs in Amorphous GeSe Using Machine Learning Interatomic Potentials
*Minseok Moon1, Seungwoo Hwang1, Jaesun Kim1, Yutack Park1, Changho Hong1, Seungwu Han1,2 (1. Seoul National Univer. (Korea), 2. Korea Institute For Advanced Study (Korea))
Keywords:
Ovonic threshold switch,amorphous GeSe,machine learning interatomic potential,midgap defect,electronic structure