The 40th Annual Meeting of the Molecular Simulation Society of Japan
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Mon. Dec 7, 2026
Tue. Dec 8, 2026
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9:25 AM - 9:40 AM JST
(12:25 AM - 12:40 AM UTC)
[A-102S]
Electric-Field-Induced Rewiring of Topological Defect Networks in Soft Matter
○Kazuaki Z. Takahashi
1
(1. AIST)
Keywords:
Soft Matter,Topological defects,Electric fields
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