[1P] Poster

[1P-230] Temperature-tolerance diversity arising from randomly accumulated mutations in C. elegans over 1,000 generations under constant-temperature conditions

*Miina Fujisawa^1,2, Seiya Kamino^1,2, Atsushi Toyoda³, Atsushi Doi⁴, Hideki Hirakawa⁵, Atsushi Kuhara^1,2,6, Akane Ohta^1,2,7 (1. Graduate school of Natural Science, Konan University, 2. Institute for Integrative neurobiology, Konan University, 3. National institute of genetics, 4. Kyusyu University, 5. Faculty of Agriculture, Kyusyu University, 6. PRIME, AMED, 7. PRESTO, JST)

Keywords:

C. elegans,cold tolerance,heat tolerance,1000 generations

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