[16psa] Poster 1

[16psa-10] Wafer-Scale Characterization of Macroscopic Defects in Aligned Carbon Nanotube Arrays Fabricated by Dimension-Limited Self-Alignment

*Bing Gao¹, Chuanhong Jin¹ (1. Zhejiang University (China))

Keywords:

carbon nanotube,characterization,scanning electron microscopy,polarized optical microscopy