Presentation Information

[17psa-23]A statistical assessment of the semiconducting proportion in single-wall carbon nanotubes based on electrostatic force microscopy

Yuki Kuwahara1, Indra M Khoris1, Fahmida Nasrin1, *Ryota Yuge2,1, Takeshi Saito1 (1. AIST (Japan), 2. NEC (Japan))

Keywords:

Carbon nanotubes,semiconducting proportion,electrostatic force microscopy


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