Presentation Information
[17psa-48]Structure and Fabrication Process Optimization of Microbolometer Array using Semi-conducting Single-walled Carbon Nanotube Networks
*Tomo Tanaka1,2, Masahiko Sano1, Masataka Noguchi1,2, Megumi Kanaori2, Toshie Miyamoto1,2, Ryota Yuge1,2 (1. NEC Corporation (Japan), 2. AIST (Japan))
Keywords:
Semi-conducting Single-walled Carbon nanotube,Infrared detector,Microbolometer
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