Presentation Information
[17psa-49]Gate Voltage Dependence of Low-Frequency Noise in Carbon Nanotube Networks
*Noriyuki Tonouchi1,2, Norika Fukuda2, Tomo Tanaka1,2, Ryota Yuge1,2 (1. NEC (Japan), 2. AIST (Japan))
Keywords:
Carbon nanotube,bolometer,low frequency noise
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