NT 25（The 25th International Conference on the Science and Applications of Nanotubes and Low-Dimensional Materials）

NT 25（The 25th International Conference on the Science and Applications of Nanotubes and Low-Dimensional Materials）

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Presentation Information

[19psa-31]Detection of process-induced contaminants on carbon nanotubes using Raman spectroscopy

*Haruki Uchiyama¹, Yudai Yoshikawa¹, Hiromichi Kataura², Yutaka Ohno^1,3 (1. Nagoya Univ. (Japan), 2. AIST (Japan), 3. IMaSS, Nagoya Univ. (Japan))

Keywords:

carbon nanotube,Raman spectroscopy,process-induced contaminant

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