[19psa] Poster 1

[19psa-38] Structural changes in semiconducting CNT networks by coating conditions

*Toshie Miyamoto^1,2, Tomo Tanaka^1,2, Megumi Kanaori², Norika Fukuda², Shunta Doi¹, Noriyuki Tonouchi^1,2, Ryota Yuge^1,2 (1. NEC Corporation (Japan), 2. National Institute of Advanced Industrial Science and Technology (Japan))

Keywords:

carbon nanotube,infrared image sensor,TCR