[TuH3] Integrated Photonic Circuits and Platforms II

3:15 PM - 3:30 PM JST(6:15 AM - 6:30 AM UTC)

[TuH3-5] Correction of Waveguide Device Characteristics Based on Process Data

○Keita Yamaguchi¹, Masashi Ota¹, Ai Yanagihara¹, Kenya Suzuki¹, Osamu Moriwaki¹ (1.NTT Corporation)

Keywords:

Planar lightwave circuits (PLCs),Optical filters,demultiplexers,demodulators,equalizers,programmable circuits/filters,dispersion compensators,and other signal conditioning devices

We propose a fabrication method that uses process data to correct the characteristics of optical devices. The manufacturing variation in the center transmission wavelength of silica-based AWG multiplexers can be suppressed to σ < 0.027-nm.