Presentation Information

[WB2-2]Fast and Accurate Nonlinear Distortion Measurement Using Probability-Maintained Multi-Notch Sequence

○Jingnan Li1,2, Tong Ye2, Xiaofei Su2, Yangyang Fan2, Ke Zhang2, Shiyu Shi2, Qiulu Yang2, Hisao Nakashima3, Takeshi Hoshida3, Zhenning Tao2, Yojiro Mori1,4, Hiroshi Hasegawa1 (1.Nagoya University, 2.Fujitsu Research & Development Center Co., Ltd., 3.Fujitsu Ltd., 4.Toyota Technological Institute)

Keywords:

Digital signal processing algorithms for optical communications,Optical transmitter and receiver subsystems

Probability-maintained multi-notch sequence, as a universal stimulus, enables fast and accurate nonlinear distortion measurement. Experiments demonstrate 0.5 dB measurement accuracy in nonlinear noise power ratio for PAM4/8 with arbitrary probabilistic shaping.