Presentation Information
[P2T6-099]Surface-Confinement-Induced Plasma–Wall Interfacial Instability in Structured PECVD Showerhead Electrodes
*Jinheon Kim1,2, Taesung Kim1 (1. Sungkyunkwan University (Korea), 2. Samsung Institute of Technology (Korea))
Keywords:
Plasma–wall interface,Surface confinement,Sheath overlap
