[P2E] Poster

[P2T5-012] Direct Measurement of Interaction Forces between Macroscopic
Silica Surfaces in Highly Concentrated Electrolyte Solutions

*Ryoto Otsubo¹, Naoyuki Ishida¹ (1. Graduate School of Science and Engineerimg, Doshisha University (Japan))

Keywords:

Underscreening,Atomic Force Microscope (AFM),Interaction force