Presentation Information
[P3T5-047]Direct Measurement of Underscreening between Silica Surfaces in Organic Solvents Containing High-Concentration Electrolytes
*Miharu Takahashi1, Naoyuki Ishida1 (1. Graduate School of Science and Engineering, Doshisha University (Japan))
Keywords:
underscreening,Atomic force microscope,organic solvents
